Since the use of a primary X-ray beam to excite fluorescent radiation from the sample was first proposed by Glocker and Schreiber in 1928, an extensive body of knowledge has been developed for X-ray fluorescence spectroscopy instrumentation, software, and sample preparation. The following links cover the practical use of XRF in great detail: 


 Quantitative X-ray Spectrometry
 By Ron Jenkins, R. W. Gould and Dale Gedcke
 Principles and Practice of X-Ray Spectrometric Analysis
 By Eugene P. Bertin
 X-Ray Spectrometry: Recent Technological Advances
 By Kouichi Tsuji, Jasna Injuk and René Grieken
 X-Ray Spectroscopy In Environmental Sciences
 By Vlado Valković
 Handbook Of Practical X-Ray Fluorescence Analysis
 By B. Beckhoff, N. Langhoff, B. Kanngiefer, R. Wedell and H. Wolff
 Handbook Of X-Ray Spectrometry
By René Grieken and Andrzej Markowicz
Microscopic X-Ray Analysis
 By Koen Janssens
A Practical Guide for the Preparation of Specimens for X‑Ray Fluorescence and X‑Diffraction
By Victor E. Buhrke, Ron Jenkins and Deane K. Smith

Guidelines for XRF analysis

By James Willis, Ken Turner and Clive Feather


 LXCG - XRF Course   

June 17 to June 21, 2019 at Hamilton College, Clinton, N.Y., 13323 U.S.A.